Of photonic crystals with different lattice constants 不同晶格常數(shù)光子晶體構成的
The lattice constant determination of metals - method of x - ray diffractometer 金屬點陣常數(shù)的測定方法x射線衍射儀法
An accurate measurement of lattice constants of the p films were carried out by gaxrd 晶格膨脹,其原因可能在于原子半徑小的碳占據(jù)了p 。
The lattice constants of the films increase and the diffraction peaks shift to low direction 薄膜的電學性質發(fā)生明顯變化,面電阻率降至106
Therefore , we deduce that the lattice constant of the covalent nanocrystallites will increase with the decreasing of the grain size 由此我們推斷共價結構納米微粒的晶格常數(shù)隨著晶粒線度的減小而增大。
Using the single crystal x - ray diffraction ( scxrd ) method , we got the lattice constant , and found it was more than that of silicon 利用單晶x - ray衍射( scxrd )對czsige單晶的晶胞進行了測試,發(fā)現(xiàn)晶胞參數(shù)發(fā)生了明顯的變化。
The change of lattice constants and the cell volume expansion are calculated , which make an important contribution to the increase of the magnetocrystalline anisotropy 計算了引起材料磁晶各向異性大大增加的點陣常數(shù)的變化和體積膨脹量。
The factors affecting the in - plane thermal conductivity of thin films discussed include the mass of particles , the well depth , and the lattice constant , etc 從粒子質量、勢阱深度、晶格常數(shù)的變化等方面討論了其對薄膜兩種材料的切向導熱系數(shù)的影響。
By controlling the parameters of deposition , fabricated films are single phase and grown well on two kinds of substrates with different lattice constants 繼而論及薄膜生長方式,具有不同失配度的襯底對薄膜產(chǎn)生的不同應力類型,光刻和鍍電極的簡略步驟。
It was found that the lattice constant increased with the decreasing grain size of some nanocrystallites , while some changed inversely 在關于納米微晶的研究中,人們發(fā)現(xiàn)有的材料的晶格常數(shù)隨著晶粒線度的減小而增大,有的材料的晶格常數(shù)隨著晶粒線度的減小而減小。